精品日本一区二区三区免费,国产精品一卡2卡三卡4卡,亚洲综合av色婷婷国产野外,久久人人爽人人爽人人片av高请

Third generation

Semiconductor Testing

family

Third generation semiconductor testing family
Home Product Test System Power Device Testing System
MENU
QT-3102 thermal resistance tester

QT-3102-XX test device type: triode, field effect tube, IGBT, diode



Support double DIE

1000W thermal resistance

Overload and undervoltage protection



Type QT-3102
Advantages QT-3102-XX test device type: triode, field effect tube, IGBT, diode
R26: Can be built into the DC test item of QT-4100 to achieve high-power built-in thermal resistance testing
R26：Dual Die testing can be implemented through scanbox
Main Features ? The maximum current and maximum voltage depend on the model. The maximum current is 20A and 50A respectively.
? The maximum voltages are 100V and 200V respectively







Testing standards